| Chairs |
Tieniu Tan, National Lab of Pattern Recognition, China |
| James Orwell, Kingston University, UK
|
| Rama Chellappa, University of Maryland, US
|
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| Workshop Organiser |
Graeme Jones, DIRC, Kingston University, United Kingdom |
| |
| Programme Committee |
Terrance Boult, University of Colorado at Colorado Sprin, US |
| Francois Bremond, INRIA Sophia-Antipolis Research Unit, France |
| Rama Chellappa, University of Maryland, US |
| Robert Collins, Pennsylvania State University, US |
| Patrick Courtney, PerkinElmer Life and Analytical Sciences, UK |
| Rita Cucchiara, Universitā degli Studi di Modena, ITALIA |
| Roy Davies, Royal Holloway, University of London, UK |
| Larry Davis, Institute for Advanced Computer Studies, USA |
| Tim Ellis, Kingston University, UK |
| Rogerio Feris, IBM Research, USA |
| James Ferryman, The University of Reading, UK |
| GianLuca Foresti, University of Udine, Italy |
| Xiang Gao, Siemens Corporate Research, USA |
| Shaogang Gong, Queen Mary University London, UK |
| Riad Hammoud, Delphi Corporation, US |
| R. Ismail Haritaoglu, Polar Rain Inc, USA |
| Janne Heikkila, Dept. of Electrical Engineering, Finland |
| Wei Ming Hu, NLPR, China |
| Kaiqi Huang, Institute of Automation CAS, China |
| Graeme Jones, DIRC, Kingston University, United Kingdom |
| Peihua Li, Hei Long Jiang University, China |
| Stan Li, National Laboratory of Pattern Recogniti, China |
| Xuelong Li, Birkbeck College, University of London, UK |
| Dimitrios Makris, Kingston University, UK |
| Lucio Marcenaro, TechnoAware srl, Italy |
| Steve Maybank, Birkbeck College, United Kingdom |
| Jerome Meessen, Intopix s.a, Belgium |
| James Orwell, Kingston University, UK |
| Vasudev Parameswaran, Siemens Corporate Research, USA |
| Federico Pernici, Universitā di Firenze, Italy |
| Justus Piater, Université de Ličge, Belgium |
| Massimo Piccardi, University of Technology, Sydney, Australia |
| Carlo Regazzoni, University of Genoa, Italy |
| Paolo Remagnino, Kingston University, UK |
| Gerhard Rigoll, Munich University of Technology, Germany |
| Neil Robertson, Heriot-Watt University, UK |
| Gerald Schaefer, Loughborough University, UK |
| Vinay Shet, Siemens Corporate Research, USA |
| Lauro Snidaro, Universitā degli Studi di Udine, Italy |
| Tieniu Tan, National Lab of Pattern Recognition, China |
| Dacheng Tao, Birkbeck College, UK |
| Stefano Tubaro, Politecnico di Milano, Italy |
| David Tweed, Image Metrics Ltd, England |
| Pramod Varshney, Syracuse University, US |
| Sergio Velastin, Kingston University, UK |
| Roberto Vezzani, D.I.I. - University of Modena and R.E., Modena |
| Ramesh Visvanathan, Siemens Corporate Research, US |
| Wei Yun Yau, Nanyang Technological University, Singapore |
| Fei Yin, Digital Imaging Research Centre, UK |
| Tao Zhao, Intuitive Surgical Inc, USA |
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